JT
►Applicaions:
Surface Roughness Measuring System、Contour Measuring System、Microscope、Semiconductor Measuring System、Scanning White Light Interferometer
►Feature:
1.Stainless steel table.
2.Supported by four pneumatic isolators.
3.Easy to clean.
4.Chemical resistant.
5.Optical microscopes.
6.Precision inspection stations.
7.Highly sensitive laboratory equipment.
8.High-accuracy measuring instruments.
9.Patent No. M490951
Surface Roughness Measuring System、Contour Measuring System、Microscope、Semiconductor Measuring System、Scanning White Light Interferometer
►Feature:
1.Stainless steel table.
2.Supported by four pneumatic isolators.
3.Easy to clean.
4.Chemical resistant.
5.Optical microscopes.
6.Precision inspection stations.
7.Highly sensitive laboratory equipment.
8.High-accuracy measuring instruments.
9.Patent No. M490951
Unit : mm
*For complete product list, please download our catalog.